TY  - CONF
A1  - Fibich, Christian
A1  - Horauer, Martin
A1  - Obermaisser, Roman
T1  - Bitstream-Level Interconnect Fault Characterization for SRAM-based FPGAs
T2  - Proceedings of the 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE 2023), pp. 1-2, 16-18 April 2023, Antwerp, Belgium
KW  - FPGA
KW  - Fault Injection
KW  - Interconnect Fault
Y1  - 
UR  - http://opus.technikum-wien.at/frontdoor/index/index/docId/3418
ER  -