@inproceedings{TaunerWidhalmHorauer,
  author    = {Tauner, Stefan and Widhalm, Dominik and Horauer, Martin},
  title     = {Synchronization Approaches for Testing Mixed-Signal SoCs under Real-Time Constraints using On-Chip Capabilities},
  series = {Proceedings of the IEEE Austrian Workshop on Microelectronics, Vienna, 28 Sept. 2015},
  booktitle = {Proceedings of the IEEE Austrian Workshop on Microelectronics, Vienna, 28 Sept. 2015},
  pages     = {36 -- 41},
  subject      = {Embedded Systems},
  language  = {en}
}
@inproceedings{WidhalmTaunerHorauer,
  author    = {Widhalm, Dominik and Tauner, Stefan and Horauer, Martin},
  title     = {Augmenting Pre-Silicon Simulation by embedding a Scripting Language in a SystemC Environment},
  series = {Proceedings of the 12th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA) 2016},
  booktitle = {Proceedings of the 12th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA) 2016},
  subject      = {Embedded Systems},
  language  = {en}
}
@misc{TaunerWidhalmHorauer,
  author    = {Tauner, Stefan and Widhalm, Dominik and Horauer, Martin},
  title     = {Synchronization Approaches for Testing Mixed-Signal SoCs under Real-Time Constraints using On-Chip Capabilities},
  subject      = {Embedded Systems},
  language  = {en}
}
@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Characterization of Interconnect Fault Effects in SRAM-based FPGAs},
  series = {Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), 3-5 May 2023, Tallinn, Estonia},
  booktitle = {Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), 3-5 May 2023, Tallinn, Estonia},
  doi       = {https://doi.org/10.1109/DDECS57882.2023.10139343},
  pages     = {65 -- 68},
  subject      = {Soft Errors},
  language  = {en}
}
@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Bitstream-Level Interconnect Fault Characterization for SRAM-based FPGAs},
  series = {Proceedings of the 2023 Design, Automation \& Test in Europe Conference \& Exhibition (DATE 2023), pp. 1-2, 16-18 April 2023, Antwerp, Belgium},
  booktitle = {Proceedings of the 2023 Design, Automation \& Test in Europe Conference \& Exhibition (DATE 2023), pp. 1-2, 16-18 April 2023, Antwerp, Belgium},
  doi       = {10.23919/DATE56975.2023.10136911},
  pages     = {2},
  subject      = {FPGA},
  language  = {en}
}