@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Characterization of Interconnect Fault Effects in SRAM-based FPGAs},
  series = {Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), 3-5 May 2023, Tallinn, Estonia},
  booktitle = {Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), 3-5 May 2023, Tallinn, Estonia},
  doi       = {https://doi.org/10.1109/DDECS57882.2023.10139343},
  pages     = {65 -- 68},
  subject      = {Soft Errors},
  language  = {en}
}