@inproceedings{ArmengaudRothensteinerSteiningeretal.,
  author    = {Armengaud, Eric and Rothensteiner, Florian and Steininger, Andreas and Pallierer, Roman and Horauer, Martin and Zauner, Martin},
  title     = {A Structured Approach for the Systematic Test of Embedded Automotive Communication Systems},
  series = {paper 2.1 of the International Test Conference (ITC 2005), November, Austin/Texas, USA},
  booktitle = {paper 2.1 of the International Test Conference (ITC 2005), November, Austin/Texas, USA},
  subject      = {Testing},
  language  = {en}
}
@inproceedings{PalliererHorauerZauneretal.,
  author    = {Pallierer, Roman and Horauer, Martin and Zauner, Martin and Steininger, Andreas and Armengaud, Eric and Rothensteiner, Florian},
  title     = {A Generic Tool for Systematic Tests in Embedded Automotive Communication Systems},
  series = {Proceedings of the Embedded World Conference 2005, February, Nuremberg, Germany},
  booktitle = {Proceedings of the Embedded World Conference 2005, February, Nuremberg, Germany},
  pages     = {42 -- 49},
  subject      = {Automotive},
  language  = {de}
}
@inproceedings{ArmengaudSteiningerHorauer,
  author    = {Armengaud, Eric and Steininger, Andreas and Horauer, Martin},
  title     = {Efficient Stimulus Generation for Remote Testing of Distributed Systems - The FlexRay Example},
  series = {Proceedings of the 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2005), September, Catania, Italy},
  booktitle = {Proceedings of the 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2005), September, Catania, Italy},
  pages     = {763 -- 770},
  subject      = {Testing},
  language  = {en}
}
@inproceedings{ArmengaudSteiningerHorauer,
  author    = {Armengaud, Eric and Steininger, Andreas and Horauer, Martin},
  title     = {A Flexible Hardware Architecture for Fast Access on Large Non-Volatile Memories},
  series = {Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary},
  booktitle = {Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary},
  pages     = {113 -- 120},
  subject      = {Hardware Architecture},
  language  = {en}
}
@inproceedings{ArmengaudSteiningerHorauer,
  author    = {Armengaud, Eric and Steininger, Andreas and Horauer, Martin},
  title     = {A Method for Bit Level Test and Diagnosis of Communication Services},
  series = {Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary},
  booktitle = {Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary},
  pages     = {69 -- 74},
  subject      = {Testing},
  language  = {en}
}