@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Device- and Temperature Dependency of Systematic Fault Injection Results in Artix-7 and iCE40 FPGAs},
  series = {Proceedings of the 2021 Design, Automation \& Test in Europe Conference \& Exhibition (DATE), 1-5 February 2021, Grenoble, France},
  booktitle = {Proceedings of the 2021 Design, Automation \& Test in Europe Conference \& Exhibition (DATE), 1-5 February 2021, Grenoble, France},
  pages     = {1600 -- 1605},
  subject      = {FPGA},
  language  = {en}
}
@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Vulnerability Analysis of Storage Elements in HLS-Generated Designs using High-Level Profiling},
  series = {Proceedings of the 2nd International Conference on System Reliability and Safety (ICSRS2017), 20-22 December 2017, Milan, Italy},
  booktitle = {Proceedings of the 2nd International Conference on System Reliability and Safety (ICSRS2017), 20-22 December 2017, Milan, Italy},
  pages     = {190 -- 194},
  subject      = {High-Level Synthesis},
  language  = {en}
}
@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Characterization of Interconnect Fault Effects in SRAM-based FPGAs},
  series = {Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), 3-5 May 2023, Tallinn, Estonia},
  booktitle = {Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2023), 3-5 May 2023, Tallinn, Estonia},
  doi       = {https://doi.org/10.1109/DDECS57882.2023.10139343},
  pages     = {65 -- 68},
  subject      = {Soft Errors},
  language  = {en}
}
@inproceedings{FibichHorauerObermaisser,
  author    = {Fibich, Christian and Horauer, Martin and Obermaisser, Roman},
  title     = {Bitstream-Level Interconnect Fault Characterization for SRAM-based FPGAs},
  series = {Proceedings of the 2023 Design, Automation \& Test in Europe Conference \& Exhibition (DATE 2023), pp. 1-2, 16-18 April 2023, Antwerp, Belgium},
  booktitle = {Proceedings of the 2023 Design, Automation \& Test in Europe Conference \& Exhibition (DATE 2023), pp. 1-2, 16-18 April 2023, Antwerp, Belgium},
  doi       = {10.23919/DATE56975.2023.10136911},
  pages     = {2},
  subject      = {FPGA},
  language  = {en}
}