TY  - CHAP
A1  - Fibich, Christian
A1  - Horauer, Martin
A1  - Obermaisser, Roman
T1  - Device- and Temperature Dependency of Systematic Fault Injection Results in Artix-7 and iCE40 FPGAs
T2  - Proceedings of the 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-5 February 2021, Grenoble, France
KW  - FPGA
KW  - Fault Injection
KW  - Device Variations
Y1  - 
SP  - 1600
EP  - 1605
ER  -