TY  - CHAP
A1  - Fibich, Christian
A1  - Horauer, Martin
A1  - Obermaisser, Roman
T1  - Reliability-Enhanced High-Level Synthesis using Memory Profiling and Fault Injection
T2  - 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE), Vancouver, BC, Canada, 2019
KW  - Circuit faults
KW  - Reliability engineering
KW  - Field programmable gate arrays
KW  - Fault tolerance
KW  - Fault tolerant systems
Y1  - 2019
SP  - 1363
EP  - 1370
ER  -