TY - CHAP A1 - Armengaud, Eric A1 - Rothensteiner, Florian A1 - Steininger, Andreas A1 - Pallierer, Roman A1 - Horauer, Martin A1 - Zauner, Martin T1 - A Structured Approach for the Systematic Test of Embedded Automotive Communication Systems T2 - paper 2.1 of the International Test Conference (ITC 2005), November, Austin/Texas, USA KW - Testing KW - Automotive KW - Embedded Systems KW - Communication Systems Y1 - 2019 ER - TY - CHAP A1 - Pallierer, Roman A1 - Horauer, Martin A1 - Zauner, Martin A1 - Steininger, Andreas A1 - Armengaud, Eric A1 - Rothensteiner, Florian T1 - A Generic Tool for Systematic Tests in Embedded Automotive Communication Systems T2 - Proceedings of the Embedded World Conference 2005, February, Nuremberg, Germany KW - Automotive KW - Communication Systems KW - Embedded Systems KW - Testing Y1 - 2019 SP - 42 EP - 49 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin T1 - Efficient Stimulus Generation for Remote Testing of Distributed Systems - The FlexRay Example T2 - Proceedings of the 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2005), September, Catania, Italy KW - Testing KW - Distributed Systems Y1 - 2019 SP - 763 EP - 770 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin T1 - A Flexible Hardware Architecture for Fast Access on Large Non-Volatile Memories T2 - Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary KW - Hardware Architecture KW - Memory Access Y1 - 2019 SP - 113 EP - 120 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin T1 - A Method for Bit Level Test and Diagnosis of Communication Services T2 - Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary KW - Testing KW - Communication Service Y1 - 2019 SP - 69 EP - 74 ER -