TY  - CHAP
A1  - Armengaud, Eric
A1  - Rothensteiner, Florian
A1  - Steininger, Andreas
A1  - Pallierer, Roman
A1  - Horauer, Martin
A1  - Zauner, Martin
T1  - A Structured Approach for the Systematic Test of Embedded Automotive Communication Systems
T2  - paper 2.1 of the International Test Conference (ITC 2005), November, Austin/Texas, USA
KW  - Testing
KW  - Automotive
KW  - Embedded Systems
KW  - Communication Systems
Y1  - 2019
ER  - 
TY  - CHAP
A1  - Horauer, Martin
T1  - Concepts and Tools for the Test of the Communication Sub-System of Time-Triggered Distributed Embedded Systems
T2  - Proceedings of the 3rd IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, MESA07, Sept. 4-7, 2007, Las Vegas, USA
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
ER  - 
TY  - CHAP
A1  - Praprotnik, Oliver
A1  - Gartner, Mario
A1  - Zauner, Martin
A1  - Horauer, Martin
T1  - A Test Suite for System Tests of Distributed Automotive Electronics,
T2  - Proceedings of the Second International Conference on Advances in Circuits, Electronics and Micro-electronics (CENICS 2009), October 11-16, 2009 - Sliema, Malta
KW  - Embedded Systems
KW  - Automotive
KW  - Testing
Y1  - 2019
ER  - 
TY  - CHAP
A1  - Reinbacher, Thomas
A1  - Steininger, Andreas
A1  - Müller, Tobias
A1  - Horauer, Martin
A1  - Brauer, Jörg
T1  - Hardware Support for Efficient Testing of Embedded Software
T2  - Proceedings of the 7th ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications, paper DETC2011-47139, Washington DC, USA, Aug. 29-31, 2011
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
SP  - 1
EP  - 10
ER  - 
TY  - CHAP
A1  - Reinbacher, Thomas
A1  - Horauer, Martin
A1  - Schlich, Bastian
T1  - Using 3-valued Memory Representation for State Space Reduction in Embedded Assembly Code Model Checking
T2  - roceedings of the 12th IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS 2009), April 15-17, 2009, Liberec, Czech Republic
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
SP  - 114
EP  - 119
ER  - 
TY  - CHAP
A1  - Reinbacher, Thomas
A1  - Brauer, Jörg
A1  - Horauer, Martin
A1  - Steininger, Andreas
A1  - Kowalewski, Stefan
T1  - Test-Case Generation for Embedded Binary Code Using Abstract Interpretation
T2  - Annual Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS 2010), Brno, 2010
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
ER  - 
TY  - CHAP
A1  - Reinbacher, Thomas
A1  - Gückel, Dominique
A1  - Horauer, Martin
T1  - Testing Microcontroller Software Simulators
T2  - Proceedings of the 1st Workshop on Software Language Engineering for Cyber Physical Systems at Informatik 2011, Berlin, Germany, Oct. 04-07, 2011
KW  - Embedded Systems
KW  - Microcontroller
KW  - Testing
Y1  - 2019
ER  - 
TY  - CHAP
A1  - Horauer, Martin
A1  - Praprotnik, Oliver
A1  - Zauner, Martin
A1  - Höller, Roland
A1  - Milbredt, Paul
T1  - A Test Tool for FlexRay-based Embedded Systems
T2  - Proceedings of the 2nd IEEE International Symposium on Industrial Embedded Systems (SIES'2007), Lisbon - Portugal, 4-6 July, 2007
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
SN  - 1-4244-0840-7
SP  - 349
EP  - 352
ER  - 
TY  - CHAP
A1  - Milbredt, Paul
A1  - Steininger, Andreas
A1  - Horauer, Martin
T1  - Automated Testing of FlexRay Clusters for System Inconsistencies in Automotive Networks
T2  - Proceedings of the 4th IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2008), Jan. 23-25, 2008, Hong Kong
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
SP  - 533
EP  - 538
ER  - 
TY  - CHAP
A1  - Zauner, Martin
A1  - Praprotnik, Oliver
A1  - Horauer, Martin
T1  - Neue Testlösungen für die Automobilelektronik
T2  - Tagungsband zum 2. Forschungsforum der österreichischen Fachhochschulen 26.-27. März 2008, FH Oberösterreich, Campus Wels
KW  - Embedded Systems
KW  - Testing
Y1  - 2019
SN  - 978-3-8322-7023-0
SP  - 267
EP  - 273
PB  - Shaker Verlag
ER  -