TY - CHAP A1 - Armengaud, Eric A1 - Rothensteiner, Florian A1 - Steininger, Andreas A1 - Pallierer, Roman A1 - Horauer, Martin A1 - Zauner, Martin T1 - A Structured Approach for the Systematic Test of Embedded Automotive Communication Systems T2 - paper 2.1 of the International Test Conference (ITC 2005), November, Austin/Texas, USA KW - Testing KW - Automotive KW - Embedded Systems KW - Communication Systems Y1 - 2019 ER - TY - CHAP A1 - Horauer, Martin T1 - Concepts and Tools for the Test of the Communication Sub-System of Time-Triggered Distributed Embedded Systems T2 - Proceedings of the 3rd IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, MESA07, Sept. 4-7, 2007, Las Vegas, USA KW - Embedded Systems KW - Testing Y1 - 2019 ER - TY - CHAP A1 - Praprotnik, Oliver A1 - Gartner, Mario A1 - Zauner, Martin A1 - Horauer, Martin T1 - A Test Suite for System Tests of Distributed Automotive Electronics, T2 - Proceedings of the Second International Conference on Advances in Circuits, Electronics and Micro-electronics (CENICS 2009), October 11-16, 2009 - Sliema, Malta KW - Embedded Systems KW - Automotive KW - Testing Y1 - 2019 ER - TY - CHAP A1 - Reinbacher, Thomas A1 - Steininger, Andreas A1 - Müller, Tobias A1 - Horauer, Martin A1 - Brauer, Jörg T1 - Hardware Support for Efficient Testing of Embedded Software T2 - Proceedings of the 7th ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications, paper DETC2011-47139, Washington DC, USA, Aug. 29-31, 2011 KW - Embedded Systems KW - Testing Y1 - 2019 SP - 1 EP - 10 ER - TY - CHAP A1 - Reinbacher, Thomas A1 - Horauer, Martin A1 - Schlich, Bastian T1 - Using 3-valued Memory Representation for State Space Reduction in Embedded Assembly Code Model Checking T2 - roceedings of the 12th IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS 2009), April 15-17, 2009, Liberec, Czech Republic KW - Embedded Systems KW - Testing Y1 - 2019 SP - 114 EP - 119 ER - TY - CHAP A1 - Reinbacher, Thomas A1 - Brauer, Jörg A1 - Horauer, Martin A1 - Steininger, Andreas A1 - Kowalewski, Stefan T1 - Test-Case Generation for Embedded Binary Code Using Abstract Interpretation T2 - Annual Doctoral Workshop on Mathematical and Engineering Methods in Computer Science (MEMICS 2010), Brno, 2010 KW - Embedded Systems KW - Testing Y1 - 2019 ER - TY - CHAP A1 - Reinbacher, Thomas A1 - Gückel, Dominique A1 - Horauer, Martin T1 - Testing Microcontroller Software Simulators T2 - Proceedings of the 1st Workshop on Software Language Engineering for Cyber Physical Systems at Informatik 2011, Berlin, Germany, Oct. 04-07, 2011 KW - Embedded Systems KW - Microcontroller KW - Testing Y1 - 2019 ER - TY - CHAP A1 - Horauer, Martin A1 - Praprotnik, Oliver A1 - Zauner, Martin A1 - Höller, Roland A1 - Milbredt, Paul T1 - A Test Tool for FlexRay-based Embedded Systems T2 - Proceedings of the 2nd IEEE International Symposium on Industrial Embedded Systems (SIES'2007), Lisbon - Portugal, 4-6 July, 2007 KW - Embedded Systems KW - Testing Y1 - 2019 SN - 1-4244-0840-7 SP - 349 EP - 352 ER - TY - CHAP A1 - Milbredt, Paul A1 - Steininger, Andreas A1 - Horauer, Martin T1 - Automated Testing of FlexRay Clusters for System Inconsistencies in Automotive Networks T2 - Proceedings of the 4th IEEE International Symposium on Electronic Design, Test & Applications (DELTA 2008), Jan. 23-25, 2008, Hong Kong KW - Embedded Systems KW - Testing Y1 - 2019 SP - 533 EP - 538 ER - TY - CHAP A1 - Zauner, Martin A1 - Praprotnik, Oliver A1 - Horauer, Martin T1 - Neue Testlösungen für die Automobilelektronik T2 - Tagungsband zum 2. Forschungsforum der österreichischen Fachhochschulen 26.-27. März 2008, FH Oberösterreich, Campus Wels KW - Embedded Systems KW - Testing Y1 - 2019 SN - 978-3-8322-7023-0 SP - 267 EP - 273 PB - Shaker Verlag ER - TY - CHAP A1 - Pallierer, Roman A1 - Horauer, Martin A1 - Zauner, Martin A1 - Steininger, Andreas A1 - Armengaud, Eric A1 - Rothensteiner, Florian T1 - A Generic Tool for Systematic Tests in Embedded Automotive Communication Systems T2 - Proceedings of the Embedded World Conference 2005, February, Nuremberg, Germany KW - Automotive KW - Communication Systems KW - Embedded Systems KW - Testing Y1 - 2019 SP - 42 EP - 49 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin T1 - Efficient Stimulus Generation for Remote Testing of Distributed Systems - The FlexRay Example T2 - Proceedings of the 10th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2005), September, Catania, Italy KW - Testing KW - Distributed Systems Y1 - 2019 SP - 763 EP - 770 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin T1 - A Method for Bit Level Test and Diagnosis of Communication Services T2 - Proceedings of the 8th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2005), April, Sopron, Hungary KW - Testing KW - Communication Service Y1 - 2019 SP - 69 EP - 74 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin T1 - An Efficient Test and Diganosis Environment for Communication Controllers T2 - Proceedings of Austrochip 2006, 11 October, Vienna, Austria KW - Testing KW - Communication Controller Y1 - 2019 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin A1 - Pallierer, Roman T1 - A Layer Model for the Systematic Test of Time-Triggered Automotive Communication Systems T2 - Proceedings of the 5th Workshop on Factory Communication Systems (WFCS 2004), September 22-24, Vienna, Austria KW - Testing KW - Automotive KW - Communication Systems Y1 - 2019 SP - 275 EP - 283 ER -