TY  - CHAP
A1  - Hausladen, Jürgen
A1  - Gerstmayer, Florian
A1  - Jerabek, Thomas
A1  - Horauer, Martin
T1  - Integration of Static Worst-Case Execution Time & Stack Usage Analysis for Embedded Systems Software in a Cloud-Based Development Environment
T2  - 13th ASMEE/IEEE International Conference on Mechatronic & Embedded Systems & Applications (MESA 2017)
KW  - Cloud
KW  - Stack Usage
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Hausladen, Jürgen
A1  - Gerstmayer, Florian
A1  - Kramer, Michael
A1  - Horauer, Martin
T1  - Methods for Protection of Iintellectual Property in Embedded Software - A Survey
T2  - 13th ASMEE/IEEE International Conference on Mechatronic & Embedded Systems & Applications (MESA 2017)
KW  - Intellectual Property
KW  - Protection Methods
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Gerstmayer, Florian
A1  - Hausladen, Jürgen
A1  - Kramer, Michael
A1  - Horauer, Martin
T1  - A Binary Protection Framework for Embedded Systems Software
T2  - 12th IEEE International Symposium on Industrial Embedded Systems (SIES 2017)
KW  - Protection Framework
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - GEN
A1  - Gerstmayer, Florian
A1  - Hausladen, Jürgen
A1  - Kramer, Michael
A1  - Horauer, Martin
T1  - A Binary Protection Framework for Embedded Systems Software
KW  - Protection Framework
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Fibich, Christian
A1  - Horauer, Martin
A1  - Obermaisser, Roman
T1  - HLShield: A Reliability Enhancement Framework for High-Level Synthesis
T2  - 12th IEEE International Symposium on Industrial Embedded Systems (SIES 2017)
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Fibich, Christian
A1  - Horauer, Martin
A1  - Obermaisser, Roman
T1  - Vulnerability Analysis of Storage Elements in HLS-Generated Designs using High-Level Profiling
T2  - Proceedings of the 2nd International Conference on System Reliability and Safety (ICSRS2017), 20-22 December 2017, Milan, Italy
KW  - High-Level Synthesis
KW  - Functional Safety
KW  - FPGA
Y1  - 2017
SP  - 190
EP  - 194
ER  -