TY  - CHAP
A1  - Praprotnik, Oliver
A1  - Gartner, Mario
A1  - Zauner, Martin
A1  - Horauer, Martin
T1  - A Test Suite for System Tests of Distributed Automotive Electronics,
T2  - Proceedings of the Second International Conference on Advances in Circuits, Electronics and Micro-electronics (CENICS 2009), October 11-16, 2009 - Sliema, Malta
KW  - Embedded Systems
KW  - Automotive
KW  - Testing
Y1  - 2019
ER  - 
TY  - GEN
A1  - Glatz, Bernd
A1  - Cleary, Fionn
A1  - Horauer, Martin
A1  - Schuster, Harald
A1  - Balog, Peter
T1  - Complementing Testing of IEC61499 Function Blocks with Model-Checking
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Puhm, Andreas
A1  - Kramer, Michael
A1  - Horauer, Martin
T1  - An Algorithm to Evaluate and Build Schedules for a Distributed Sensor System with Respect to Clock Synchronization
T2  - Proceedings of the Ninth International Conference on Sensor Technologies and Applications (SENSORCOMM), Venice 2015
KW  - Clock Synchronization
Y1  - 
SP  - 64
EP  - 70
ER  - 
TY  - CHAP
A1  - Armengaud, Eric
A1  - Steininger, Andreas
A1  - Horauer, Martin
A1  - Pallierer, Roman
A1  - Friedl, Hannes
T1  - A Monitoring concept for an Automotive Distributed Network - The Flexray Example
T2  - Proceedings of the 7th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2004), 18-21 April 2004, Slovakia
KW  - Monitoring
KW  - Automotive Network
Y1  - 2019
SP  - 173
EP  - 178
ER  - 
TY  - CHAP
A1  - Armengaud, Eric
A1  - Steininger, Andreas
A1  - Horauer, Martin
A1  - Pallierer, Roman
T1  - Design Trade-Offs for Systematic Tests of Embedded Communication Systems
T2  - Supplemental Volume to the 2004 International Conference on Dependable Systems and Networks (DSN 2004), June 28 - July 1, Florence, Italy
KW  - Test Design
KW  - Embedded Systems
KW  - Communication Systems
Y1  - 2019
SP  - 118
EP  - 119
ER  - 
TY  - CHAP
A1  - Pescha, David
A1  - Horauer, Martin
T1  - Eventroms in IEC 61499 Applications
T2  - Proceedings of XXXIII Conference on Design of Circuits and Integrated Systems (DCIS  ’2018), November 14-16, 2018, Lyon, France
KW  - IEC Standards
KW  - Storms
KW  - Sensors
KW  - Monitoring
KW  - Hardware
Y1  - 2019
SN  - 978-1-7281-0171-2
ER  - 
TY  - CHAP
A1  - Hausladen, Jürgen
A1  - Gerstmayer, Florian
A1  - Jerabek, Thomas
A1  - Horauer, Martin
T1  - Integration of Static Worst-Case Execution Time & Stack Usage Analysis for Embedded Systems Software in a Cloud-Based Development Environment
T2  - 13th ASMEE/IEEE International Conference on Mechatronic & Embedded Systems & Applications (MESA 2017)
KW  - Cloud
KW  - Stack Usage
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Hausladen, Jürgen
A1  - Gerstmayer, Florian
A1  - Kramer, Michael
A1  - Horauer, Martin
T1  - Methods for Protection of Iintellectual Property in Embedded Software - A Survey
T2  - 13th ASMEE/IEEE International Conference on Mechatronic & Embedded Systems & Applications (MESA 2017)
KW  - Intellectual Property
KW  - Protection Methods
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Glatz, Bernd
A1  - Schuster, Harald
A1  - Horauer, Martin
A1  - Rauscher, Thomas
A1  - Obermaisser, Roman
T1  - Fault Injection for IEC 61499 Applications
T2  - Proceedings of the 21st IEEE International Conference on Emerging Technologies and Factory Automation (ETFA 2016), Berlin, Germany, 2016-09-06 -- 2016-09-09
KW  - Embedded Systems
Y1  - 2018
ER  - 
TY  - CHAP
A1  - Gerstmayer, Florian
A1  - Hausladen, Jürgen
A1  - Kramer, Michael
A1  - Horauer, Martin
T1  - A Binary Protection Framework for Embedded Systems Software
T2  - 12th IEEE International Symposium on Industrial Embedded Systems (SIES 2017)
KW  - Protection Framework
KW  - Embedded Systems
Y1  - 2018
ER  -