TY  - CHAP
A1  - Praprotnik, Oliver
A1  - Zauner, Martin
T1  - System-Testumgebung für die verteilte Automobilelektronik
T2  - Informationstagung Mikroelektronik (ME 2010),  Vienna, Austria, April 7-8, 2010
KW  - Embedded Systems
KW  - Automotive
KW  - Testing
Y1  - 2019
SP  - 305
EP  - 310
ER  - 
TY  - CHAP
A1  - Niklas, Peter
A1  - Zauner, Martin
A1  - Horauer, Martin
T1  - Development of an Embedded Monitoring Device for a Manufacturing Plant
T2  - Proceedings of the 2010 IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA 2010), July 15-17, 2010, Qingdao, China
KW  - Embedded Systems
KW  - Manufacturing
Y1  - 2019
SP  - 398
EP  - 402
ER  -