TY - CHAP A1 - Fibich, Christian A1 - Tauner, Stefan A1 - Rössler, Peter A1 - Horauer, Martin A1 - Krapfenbauer, Markus A1 - Linauer, Martin A1 - Matschnig, Martin A1 - Taucher, Herbert T1 - Evaluation of Open-Source Linear Algebra Libraries in Embedded Applications T2 - 8th Mediterranean Conference on Embedded Computing (MECO), co-sponsored by IEEE, June 10-14, 2019, Budva, Montenegro KW - Embedded Systems KW - Basic Linear Algebra Subprograms KW - BLAS KW - Benchmark Y1 - 2019 ER - TY - CHAP A1 - Armengaud, Eric A1 - Rothensteiner, Florian A1 - Steininger, Andreas A1 - Pallierer, Roman A1 - Horauer, Martin A1 - Zauner, Martin T1 - A Structured Approach for the Systematic Test of Embedded Automotive Communication Systems T2 - paper 2.1 of the International Test Conference (ITC 2005), November, Austin/Texas, USA KW - Testing KW - Automotive KW - Embedded Systems KW - Communication Systems Y1 - 2019 ER - TY - CHAP A1 - Praprotnik, Oliver A1 - Gartner, Mario A1 - Zauner, Martin A1 - Horauer, Martin T1 - A Test Suite for System Tests of Distributed Automotive Electronics, T2 - Proceedings of the Second International Conference on Advances in Circuits, Electronics and Micro-electronics (CENICS 2009), October 11-16, 2009 - Sliema, Malta KW - Embedded Systems KW - Automotive KW - Testing Y1 - 2019 ER - TY - CHAP A1 - Niklas, Peter A1 - Zauner, Martin A1 - Horauer, Martin T1 - Development of an Embedded Monitoring Device for a Manufacturing Plant T2 - Proceedings of the 2010 IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA 2010), July 15-17, 2010, Qingdao, China KW - Embedded Systems KW - Manufacturing Y1 - 2019 SP - 398 EP - 402 ER - TY - JOUR A1 - Horauer, Martin A1 - Zauner, Martin A1 - Schuster, Harald T1 - A System-level Test for Automotive Communication Subsystems JF - e&i, Elektrotechnik und Informationstechnik, Heft 6.2011 KW - Automotive KW - Embedded Systems Y1 - 2019 IS - Heft 6.2011 ER - TY - CHAP A1 - Horauer, Martin A1 - Praprotnik, Oliver A1 - Zauner, Martin A1 - Höller, Roland A1 - Milbredt, Paul T1 - A Test Tool for FlexRay-based Embedded Systems T2 - Proceedings of the 2nd IEEE International Symposium on Industrial Embedded Systems (SIES'2007), Lisbon - Portugal, 4-6 July, 2007 KW - Embedded Systems KW - Testing Y1 - 2019 SN - 1-4244-0840-7 SP - 349 EP - 352 ER - TY - CHAP A1 - Zauner, Martin A1 - Praprotnik, Oliver A1 - Horauer, Martin T1 - Neue Testlösungen für die Automobilelektronik T2 - Tagungsband zum 2. Forschungsforum der österreichischen Fachhochschulen 26.-27. März 2008, FH Oberösterreich, Campus Wels KW - Embedded Systems KW - Testing Y1 - 2019 SN - 978-3-8322-7023-0 SP - 267 EP - 273 PB - Shaker Verlag ER - TY - CHAP A1 - Pallierer, Roman A1 - Horauer, Martin A1 - Zauner, Martin A1 - Steininger, Andreas A1 - Armengaud, Eric A1 - Rothensteiner, Florian T1 - A Generic Tool for Systematic Tests in Embedded Automotive Communication Systems T2 - Proceedings of the Embedded World Conference 2005, February, Nuremberg, Germany KW - Automotive KW - Communication Systems KW - Embedded Systems KW - Testing Y1 - 2019 SP - 42 EP - 49 ER - TY - CHAP A1 - Horauer, Martin A1 - Rothensteiner, Florian A1 - Zauner, Martin A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Friedl, Hannes A1 - Pallierer, Roman T1 - An FPGA based SoC Design for Testing Embedded Automotive Communication Systems employing the FlexRay Protocol T2 - Proceedings of Austrochip 2004, October 2004, Villach, Austria KW - Embedded Systems KW - Automotive KW - Communication Systems Y1 - 2019 SP - 119 EP - 123 ER - TY - CHAP A1 - Schuster, Harald A1 - Horauer, Martin A1 - Kramer, Michael A1 - Leibhart, Heinz A1 - Büger, Josef T1 - A Log-Tool Suite for Embedded Systems T2 - Proceedings of the 7th International conference on Advances in Circuits, Electronics and Micro-electronics (CENICS), November 16-20, 2014 - Lisbon, Portugal KW - Embedded Systems Y1 - ER - TY - CHAP A1 - Glatz, Bernd A1 - Cleary, Fionn A1 - Horauer, Martin A1 - Schuster, Harald A1 - Balog, Peter T1 - Complementing Testing of IEC61499 Function Blocks with Model-Checking T2 - Proceedings of the 12th IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, (MESA2016), Auckland, New Zealand, 29-31 August 2016 KW - Embedded Systems Y1 - 2018 ER - TY - CHAP A1 - Reinbacher, Thomas A1 - Brauer, Jörg A1 - Horauer, Martin A1 - Schlich, Bastian T1 - Refining Assembly Code Static Analysis for the Intel MCS-51 Microcontroller T2 - Proceedings of the 4th IEEE Symposium of Industrial Embedded Systems (SIES 2009), July 8-10, 2009, Lausanne, Switzerland KW - Embedded Systems KW - Microcontroller Y1 - 2019 SP - 161 EP - 170 ER - TY - CHAP A1 - Horauer, Martin T1 - Concepts and Tools for the Test of the Communication Sub-System of Time-Triggered Distributed Embedded Systems T2 - Proceedings of the 3rd IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications, MESA07, Sept. 4-7, 2007, Las Vegas, USA KW - Embedded Systems KW - Testing Y1 - 2019 ER - TY - CHAP A1 - Horauer, Martin A1 - Rössler, Peter T1 - FlexRay (Chapter 44) T2 - The Industrial Electronics Handbook (2nd Edition), CRC Press, 2011 KW - Industrial KW - Communication System KW - Embedded Systems Y1 - 2019 PB - CRC Press ER - TY - CHAP A1 - Balog, Peter A1 - Horauer, Martin A1 - Rössler, Peter T1 - Remote LAB infrastructure for Distance Learning Courses at the Undergraduate Level in Embedded Systems Design T2 - Proceedings of the 2009 ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications (MESA 2009), DETC2009-87148, Aug. 30-Sept. 02, 2009, San Diego, USA KW - Embedded Systems KW - Teaching Y1 - 2019 ER - TY - GEN A1 - Schuster, Harald A1 - Horauer, Martin A1 - Kramer, Michael A1 - Liebhart, Heinz A1 - Büger, Josef T1 - A Log-Tool Suite for Embedded Systems KW - Embedded Systems Y1 - ER - TY - GEN A1 - Glatz, Bernd A1 - Cleary, Fionn A1 - Horauer, Martin A1 - Schuster, Harald A1 - Balog, Peter T1 - Complementing Testing of IEC61499 Function Blocks with Model-Checking KW - Embedded Systems Y1 - 2018 ER - TY - CHAP A1 - Armengaud, Eric A1 - Steininger, Andreas A1 - Horauer, Martin A1 - Pallierer, Roman T1 - Design Trade-Offs for Systematic Tests of Embedded Communication Systems T2 - Supplemental Volume to the 2004 International Conference on Dependable Systems and Networks (DSN 2004), June 28 - July 1, Florence, Italy KW - Test Design KW - Embedded Systems KW - Communication Systems Y1 - 2019 SP - 118 EP - 119 ER - TY - CHAP A1 - Hausladen, Jürgen A1 - Gerstmayer, Florian A1 - Jerabek, Thomas A1 - Horauer, Martin T1 - Integration of Static Worst-Case Execution Time & Stack Usage Analysis for Embedded Systems Software in a Cloud-Based Development Environment T2 - 13th ASMEE/IEEE International Conference on Mechatronic & Embedded Systems & Applications (MESA 2017) KW - Cloud KW - Stack Usage KW - Embedded Systems Y1 - 2018 ER - TY - CHAP A1 - Hausladen, Jürgen A1 - Gerstmayer, Florian A1 - Kramer, Michael A1 - Horauer, Martin T1 - Methods for Protection of Iintellectual Property in Embedded Software - A Survey T2 - 13th ASMEE/IEEE International Conference on Mechatronic & Embedded Systems & Applications (MESA 2017) KW - Intellectual Property KW - Protection Methods KW - Embedded Systems Y1 - 2018 ER -