TY  - JOUR
A1  - Polzer, Thomas
A1  - Huerner, Florian
T1  - Refined metastability characterization using a time-to-digital converter
JF  - Microelectronics Reliability, January 2018
KW  - Microelectronic
KW  - Embedded Systems
Y1  - 2019
IS  - Microelectronics Reliability, January 2018, Volume 80
ER  -