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Design Trade-Offs for Systematic Tests of Embedded Communication Systems

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Metadaten
Author:Eric Armengaud, Andreas Steininger, Martin Horauer, Roman Pallierer
Parent Title (English):Supplemental Volume to the 2004 International Conference on Dependable Systems and Networks (DSN 2004), June 28 - July 1, Florence, Italy
Document Type:Conference Proceeding
Language:English
Completed Date:2004/06/28
Date of first Publication:2019/01/30
Responsibility for metadata:Fachhochschule Technikum Wien
Release Date:2019/01/30
GND Keyword:Communication Systems; Embedded Systems; Test Design
First Page:118
Last Page:119
Publish on Website:1
Open Access:0
Reviewed:0
Invited:0
Keynote:0
Department:Department Electronic Engineering
Research Focus:Embedded Systems & Cyber-Physical Systems
Studienjahr:2003/2004
Projects:Import