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Development of an Embedded Monitoring Device for a Manufacturing Plant

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Metadaten
Author:Peter Niklas, Martin Zauner, Martin Horauer
Parent Title (English):Proceedings of the 2010 IEEE/ASME International Conference on Mechatronic and Embedded Systems and Applications (MESA 2010), July 15-17, 2010, Qingdao, China
Document Type:Conference Proceeding
Language:English
Completed Date:2010/07/15
Date of first Publication:2019/02/04
Responsibility for metadata:Fachhochschule Technikum Wien
Release Date:2019/02/04
GND Keyword:Embedded Systems; Manufacturing
First Page:398
Last Page:402
Publish on Website:1
Open Access:0
Reviewed:0
Invited:0
Keynote:0
Department:Department Electronic Engineering
Research Focus:Embedded Systems & Cyber-Physical Systems
Studienjahr:2009/2010
Projects:Import