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Experimental Assessment of the Clique Problem in FlexRay

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Metadaten
Author:Martin Horauer, Harald Schuster, Peter Balog
Parent Title (English):Proceedings of the 8th ASME/IEEE International Conference on Mechatronic and Embedded Systems and Applications, Portland OR, USA, Aug. 04-07, 2013
Document Type:Conference Proceeding
Language:English
Completed Date:2013/08/04
Date of first Publication:2019/02/06
Responsibility for metadata:Fachhochschule Technikum Wien
Release Date:2019/02/06
GND Keyword:Embedded Systems; FlexRay
Publish on Website:1
Open Access:0
Reviewed:0
Invited:0
Keynote:0
Department:Department Electronic Engineering
Research Focus:Embedded Systems & Cyber-Physical Systems
Studienjahr:2012/2013
Projects:Import