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Refined metastability characterization using a time-to-digital converter

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Metadaten
Author:Thomas Polzer, Florian Huerner
Parent Title (English):Microelectronics Reliability, January 2018
Document Type:Article
Language:English
Completed Date:2018/01/01
Date of first Publication:2019/02/06
Responsibility for metadata:Fachhochschule Technikum Wien
Release Date:2019/02/06
GND Keyword:Embedded Systems; Microelectronic
Issue:Microelectronics Reliability, January 2018, Volume 80
Pagenumber:pp. 91-99
Publish on Website:1
Open Access:0
Reviewed:0
Department:Department Electronic Engineering
Research Focus:Embedded Systems & Cyber-Physical Systems
Studienjahr:2017/2018
Projects:Import