Reliability-Enhanced High-Level Synthesis using Memory Profiling and Fault Injection
| Author: | Christian FibichORCiD, Martin Horauer, Roman Obermaisser |
|---|---|
| Parent Title (English): | 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE), Vancouver, BC, Canada, 2019 |
| Document Type: | Conference Proceeding |
| Language: | English |
| Completed Date: | 2019/06/12 |
| Date of first Publication: | 2019/10/30 |
| Responsibility for metadata: | Fachhochschule Technikum Wien |
| Release Date: | 2019/10/30 |
| GND Keyword: | Circuit faults; Fault tolerance; Fault tolerant systems; Field programmable gate arrays; Reliability engineering |
| First Page: | 1363 |
| Last Page: | 1370 |
| Publish on Website: | 1 |
| Open Access: | 0 |
| Reviewed: | 1 |
| Invited: | 0 |
| Keynote: | 0 |
| Department: | Department Electronic Engineering |
| Dewey Decimal Classification: | 6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften |
| Research Focus: | Embedded Systems & Cyber-Physical Systems |
| Projects: | CDG |
| Studienjahr: | 2018/2019 |
